Unleashing Parallelism With Minimal Test Inflation in Multi-Threaded Test Pattern Generation
نویسندگان
چکیده
منابع مشابه
Test Pattern Generation with Restrictors
This paper extends state-of-the-art ATPG systems by including constraints, called restrictors, on the allowable values of the bits of a test vector. Such restrictors often occur in ’realworld’ circuits where certain bit positions of a test vector have to take on a particular value (e.g. in case of a reset line) or are prohibited from taking on a particular value (e.g. in order to prevent an ill...
متن کاملTest Pattern Generation and Test Application Time
As the complexity of VLSI circuits is increasing at the rate predicted by Moore's law and the switching frequencies are approaching a gigahertz, testing cost is becoming an important factor in the overall IC manufacturing cost. Testing cost is incurred by test pattern generation and test application processes. In this dissertation, we address both of these factors contributing to the testing co...
متن کاملPattern-Constrained Test Case Generation
In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In contrast, the proposed method allows for a transparent and intuitive modeling of the relations contained in the test data. For the presented approach, we utilize a general-purpose data generator: It relies on easy to und...
متن کاملObtaining Trustworthy Test Results in Multi-threaded Systems
Testing multi-threaded systems is quite a challenge. The nondeterminism of these systems makes their implementation and their test implementation far more susceptible to error. It is common to have tests of these systems that may not pass sometimes and whose failures are not caused by application faults (bugs). For instance, this can happen when test verifications (assertions) are performed at ...
متن کاملGenetic Algorithms in Test Pattern Generation
In current thesis, two test pattern generation approaches based on genetic algorithms are presented. The, first algorithm is designed so that it allows direct comparison with random method. Comparative results show that genetic algorithm performs better on large circuits, in the last stage of test generation when much of search effort must be made in order to detect still undetected faults. Exp...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Access
سال: 2018
ISSN: 2169-3536
DOI: 10.1109/access.2018.2869029